DocumentCode :
789410
Title :
Domain decomposition FDTD algorithm combined with numerical TL calibration technique and its application in parameter extraction of substrate integrated circuits
Author :
Xu, Feng ; Wu, Ke ; Hong, Wei
Author_Institution :
Dept. de Genie Electrique, Ecole Polytechnique de Montreal
Volume :
54
Issue :
1
fYear :
2006
Firstpage :
329
Lastpage :
338
Abstract :
An efficient hybrid algorithm, known as the "domain decomposition finite-difference time-domain" (DD-FDTD) method combined with a numerical thru-line (TL) calibration technique, is proposed and developed for the accurate parameter extraction of microwave circuits and structures. By means of a TL technique, the developed FDTD algorithm not only greatly increases the accuracy of numerical simulations but it also saves computation time and memory space. Moreover, the hybrid algorithm can be used for the parameter extraction of arbitrary complex circuits and structures, such as substrate integrated circuits (SICs). The SICs that are studied in this work are based on substrate integrated waveguides, which are useful for the design of millimeter-wave planar circuits such as filters, resonators, and antennas. On the basis of the characteristic features of numerical calibration process, an idea of domain decomposition is introduced to simplify the procedure of programming and simulation and to increase the simulation\´s reliability. Simulation and measurement results have verified this hybrid algorithm
Keywords :
finite difference time-domain analysis; integrated circuit design; microwave integrated circuits; FDTD algorithm; domain decomposition; finite-difference time-domain; microwave circuits; millimeter-wave planar circuits; numerical thru-line calibration; parameter extraction; substrate integrated circuits; substrate integrated waveguides; Application specific integrated circuits; Calibration; Circuit simulation; Finite difference methods; Microwave circuits; Microwave theory and techniques; Numerical simulation; Parameter extraction; Silicon carbide; Time domain analysis; Domain decomposition (DD); finite difference time domain (FDTD); numerical calibration; parameter extraction; substrate integrated circuits (SICs); substrate integrated waveguide (SIW);
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.860503
Filename :
1573830
Link To Document :
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