• DocumentCode
    789550
  • Title

    A novel phase measurement technique for IM3 components in RF power amplifiers

  • Author

    Lee, Seung-Yup ; Lee, Yong-Sub ; Jeon, Yoon-Ha

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Gyungbuk
  • Volume
    54
  • Issue
    1
  • fYear
    2006
  • Firstpage
    451
  • Lastpage
    457
  • Abstract
    This paper presents a novel measurement technique to measure the phases of intermodulation (IM) components of RF power amplifiers (PAs) with low-cost. This method can measure the phase distortions of the third-order IM components, as well as the fundamental signals generated in the PAs themselves by directly comparing the respective IM components before and after the PAs. A 45-W RF PA with an LDMOSFET in the wide-band code-division multiple-access band is implemented, and the relative changes of the IM phases of the PA are presented under various tone spacings, output power levels, and gate bias voltages. This system is very convenient for evaluating the memory effects of the PAs, and is helpful for the design of predistortion PAs and for the model extraction of PAs
  • Keywords
    MOSFET; code division multiple access; phase measurement; power amplifiers; radiofrequency amplifiers; 45 W; IM3 components; LDMOSFET; RF power amplifiers; gate bias voltages; phase distortions; phase measurement; tone spacings; wideband code division multiple access band; Broadband amplifiers; Distortion measurement; Measurement techniques; Phase distortion; Phase measurement; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Signal generators; LDMOSFET; memory effects; phase measurement; power amplifier (PA); sweet spots; two-tone test;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2005.860498
  • Filename
    1573843