DocumentCode :
789550
Title :
A novel phase measurement technique for IM3 components in RF power amplifiers
Author :
Lee, Seung-Yup ; Lee, Yong-Sub ; Jeon, Yoon-Ha
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Gyungbuk
Volume :
54
Issue :
1
fYear :
2006
Firstpage :
451
Lastpage :
457
Abstract :
This paper presents a novel measurement technique to measure the phases of intermodulation (IM) components of RF power amplifiers (PAs) with low-cost. This method can measure the phase distortions of the third-order IM components, as well as the fundamental signals generated in the PAs themselves by directly comparing the respective IM components before and after the PAs. A 45-W RF PA with an LDMOSFET in the wide-band code-division multiple-access band is implemented, and the relative changes of the IM phases of the PA are presented under various tone spacings, output power levels, and gate bias voltages. This system is very convenient for evaluating the memory effects of the PAs, and is helpful for the design of predistortion PAs and for the model extraction of PAs
Keywords :
MOSFET; code division multiple access; phase measurement; power amplifiers; radiofrequency amplifiers; 45 W; IM3 components; LDMOSFET; RF power amplifiers; gate bias voltages; phase distortions; phase measurement; tone spacings; wideband code division multiple access band; Broadband amplifiers; Distortion measurement; Measurement techniques; Phase distortion; Phase measurement; Power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Signal generators; LDMOSFET; memory effects; phase measurement; power amplifier (PA); sweet spots; two-tone test;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2005.860498
Filename :
1573843
Link To Document :
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