DocumentCode :
789692
Title :
The Impact of Field Enhancements and Charge Injection on the Pulsed Breakdown Strength of Water
Author :
Wetz, David A., Jr. ; Mankowski, John J. ; Dickens, James C. ; Kristiansen, Magne
Author_Institution :
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX
Volume :
34
Issue :
5
fYear :
2006
Firstpage :
1670
Lastpage :
1679
Abstract :
A unique theoretical model of the breakdown mechanism in water has been developed and further tested in both simulation software and experimentation. The conducted experiments test the degree to which electrode material, surface roughness, and surface area impact the dielectric strength of water. Voltage pulses with respective rise times of roughly 200 and 20 ns were applied to a water test gap producing electric fields in excess of 1.5 MV/cm. In experiments testing various electrode materials, thin film coatings of various metallic alloys and oxides were applied to Bruce-profiled stainless steel electrodes, with an effective area of 5 cm2, through ion beam deposition. Similar Bruceprofiled stainless steel electrodes with surface roughness ranging from 0.26 to 1.96 mum and effective areas ranging from 0.5 to 75 cm2 were used in the study of surface roughness and area. Additionally, shadowgraph images of a point plane geometry were taken to further understand the breakdown processes that occur
Keywords :
charge injection; electric breakdown; electric strength; electrodes; surface roughness; Bruce-profiled stainless steel electrodes; charge injection; dielectric strength; ion beam deposition; metallic alloys; metallic oxides; pulsed breakdown strength; shadowgraph images; simulation software; surface roughness; thin film coatings; voltage pulses; Conducting materials; Dielectric breakdown; Dielectric materials; Electric breakdown; Electrodes; Materials testing; Rough surfaces; Software testing; Steel; Surface roughness; Compact pulsed power; pulsed breakdown; water breakdown;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2006.881891
Filename :
1710025
Link To Document :
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