DocumentCode
789791
Title
Field emission from nanometer protuberances at high current density
Author
Fursey, G.N. ; Glazanov, D.V. ; Polezhaev, S.A.
Author_Institution
Bonch-Bruevitsch State Univ. of Telecommun., St. Petersburg, Russia
Volume
2
Issue
2
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
281
Lastpage
287
Abstract
The results of experimental and theoretical investigations of high-current-density field emission from nanometer objects on the tungsten cathode surface are presented. Such objects were microprotuberances, and spots of Zr or ZrO, produced by a thermal-field buildup process (microtips) and selective adsorption (spots). The limiting values of stable emission current densities from local areas of the cathode surface were determined. The process of the cathode heating was numerically simulated in terms of a heat transfer equation approach for three-dimensional axial-symmetric model. The dependencies of the equation´s coefficients upon temperature and mutual influence of the temperature and current distributions were taken into account. The main feature of the calculated temperature distribution consists in forming the overheated region in the inner emitter´s volume. It was established that the limiting current densities of stable emission for nanometer objects can be almost an order of magnitude higher than for the traditional field emitter, in accordance with the experimental results
Keywords
cathodes; current distribution; electron field emission; temperature distribution; vacuum breakdown; vacuum microelectronics; Zr; ZrO; cathode surface; current distributions; emission current densities; explosive electron emission; heat transfer equation; high-current-density field emission; limiting current densities; microtips; nanometer protuberances; overheated region; selective adsorption; temperature distribution; thermal-field buildup process; three-dimensional axial-symmetric model; vacuum breakdown; vacuum gap; Cathodes; Current density; Current distribution; Equations; Heat transfer; Numerical simulation; Temperature dependence; Temperature distribution; Tungsten; Zirconium;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/94.388253
Filename
388253
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