• DocumentCode
    789849
  • Title

    Degradation and Recovery of the Emission From a Graphite Cathode in Relation to the Repetition Frequency of Nanosecond Accelerating Pulses

  • Author

    Korovin, Sergei D. ; Litvinov, Evgeny A. ; Mesyats, Gennady A. ; Rostov, Vladislav V. ; Rukin, Sergei N. ; Shpak, Valery G. ; Yalandin, Michael I.

  • Author_Institution
    Inst. of High-Current Electron., Acad. of Sci., Tomsk
  • Volume
    34
  • Issue
    5
  • fYear
    2006
  • Firstpage
    1771
  • Lastpage
    1776
  • Abstract
    A study has been performed on the emissive characteristics of a cold graphite cathode in a magnetically insulated coaxial diode under the action of nanosecond accelerating pulses at a pulse repetition frequency (PRF) of up to 3.5 kHz. Emission was observed to degrade at PRF < 1 kHz and recover at PRF ~3.5 kHz. Estimates of the temperature conditions in the region of an explosive electron emission (EEE) center have shown that the pulse interval t~1 ms suffices for this region to cool down to 300 K. The cooling occurs predominantly by heat conduction. For t~0.3 ms, the residual heat is substantial. It has been proposed that there exists a frequency limit for the cathode microrelief polishing effect. The results of an experiment on the study of the mechanism of cathode emission recovery with increasing PRF are presented. Micrographs of the cathode taken after aging, photographs of the cathode in operation, and analyses of the fractional composition of the material removed from the cathode suggest that heating of some regions of the cathode emitting edge to the melting point of graphite plays an important role in the recovery of emission. This counts in favor of the hypothesized dominant contribution of thermoelectronic emission to the initiation of EEE due to the residual heat remaining in regions that have not cooled off during the pulse interval
  • Keywords
    cathodes; electron field emission; graphite; melting point; thermal conductivity; 3.5 kHz; C; cathode microrelief polishing; emission degradation; emission recovery; explosive electron emission; graphite cathode; heat conduction; magnetically insulated coaxial diode; melting point; nanosecond accelerating pulses; pulse repetition frequency; thermoelectronic emission; Acceleration; Cathodes; Coaxial components; Degradation; Diodes; Electron emission; Explosives; Frequency; Insulation; Temperature; Electron beam; emission center; explosive electron emission (EEE); micrographs; polishing effect;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2006.883374
  • Filename
    1710039