DocumentCode
790287
Title
Statistical distribution of the internal field in planar ferrites
Author
Pardavi-Horvath, Martha ; Yan, Jijin
Author_Institution
Dept. of Electr. & Comput. Eng., George Washington Univ., DC, USA
Volume
39
Issue
5
fYear
2003
Firstpage
3154
Lastpage
3156
Abstract
The effects of nonellipsoidal geometry and the role of corners and edges of planar ferrite elements in current microwave and millimeter wave devices are investigated numerically using micromagnetic methods. The noncollinear static magnetization ground state is calculated for the case of three-dimensional rectangular Y3Fe5O12 (YIG). The statistical distribution of the internal field over the YIG volume was obtained for different aspect ratios. The distribution of the internal field is bimodal. The low-field mode is concentrated in the volume, the high-field mode is produced by the surface of the ferrite. The nonuniform magnetization persists well in fields above 1.5 times the 4πMs magnetization, requiring higher bias fields for proper operation of planar ferrite devices.
Keywords
garnets; ground states; magnetic thin film devices; magnetic thin films; magnetisation; micromagnetics; microwave devices; millimetre wave devices; yttrium compounds; YFe5O12; YIG; bimodal; corners; current microwave devices; edges; high-field mode; internal field; low-field mode; micromagnetic methods; millimeter wave devices; noncollinear static magnetization ground state; nonellipsoidal geometry; planar ferrite devices; planar ferrites; statistical distribution; three-dimensional rectangular YIG; Ferrites; Geometry; Magnetization; Micromagnetics; Microwave devices; Microwave theory and techniques; Millimeter wave devices; Millimeter wave technology; Stationary state; Statistical distributions;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2003.816041
Filename
1233329
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