Title :
Separation of circumferential magnetic components from MI spectra in laser-annealed Co-based amorphous microwires
Author :
Yoon, S.S. ; Lee, B.S. ; Rheem, Y.W. ; Ahn, S.J. ; Kim, C.G. ; Kim, C.O.
Author_Institution :
Dept. of Phys., Andong Nat. Univ., Kyung-Book, South Korea
Abstract :
A commercial glass-covered Co-based amorphous microwire (Co66Fe3.8Ni1.4B11.5Si14.6Mo1.7) with metallic core diameter of 17 μm was annealed in air by illuminating the pulsed Nd:YAG laser beams under longitudinal and transverse annealing fields, denoted by Hl and Ht, respectively. The static susceptibilities by domain-wall motion and magnetization rotation, μdw and μrot, were separated from the circumferential complex permeability extracted from impedance spectra. The μrot shows a maximum value of the laser-annealed sample with Hl=20 Oe, which indicates the increased volume of axial domain in the core by laser-annealing under longitudinal magnetic field. The μdw shows maximum value at laser-annealed sample with Ht=20, indicating that the volume of axial domain in core is increased by laser annealing under transverse magnetic field.
Keywords :
amorphous magnetic materials; boron alloys; cobalt alloys; ferromagnetic materials; giant magnetoresistance; iron alloys; laser beam annealing; magnetic domain walls; magnetic permeability; magnetisation; molybdenum alloys; nickel alloys; silicon alloys; Co66Fe3.8Ni1.4B11.5Si14.6Mo1.7; YAG:Nd; YAl5O12:Nd; circumferential complex permeability; circumferential magnetic components separation; commercial glass-covered Co-based amorphous microwire; domain-wall motion; laser-annealed Co-based amorphous microwires; longitudinal annealing fields; magnetization rotation; magnetoimpedance spectra; metallic core diameter; pulsed Nd:YAG laser beams; static susceptibilities; transverse annealing fields; Amorphous magnetic materials; Amorphous materials; Annealing; Iron; Laser beams; Magnetic cores; Magnetic fields; Magnetic separation; Magnetic susceptibility; Optical pulses;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.816749