Process complexity of magnetoresistive sensors: a review

Author

Fontana, Robert E., Jr.

Author_Institution

IBM Almaden Res. Center, San Jose, CA, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2579

Lastpage

2584

Abstract

Magnetoresistive (MR) thin film sensors are presently used in a variety of hard disk and tape storage devices. Review papers have detailed the various methods and configurations required to linearize and stabilize the output signal characteristics of the MR thin film transducer. However, little emphasis has been placed on describing the complexity of such configurations with respect to materials and fabrication requirements. Specifically this review will examine MR sensor configurations from the perspective of the thin film processing technology required to implement the sensor design into a thin film head environment. The general trend is that the process complexity for MR sensors has increased in the areas of magnetic materials and patterning as the areal density performance of the sensor has improved

Keywords

magnetic heads; magnetic sensors; magnetic thin film devices; magnetoresistive devices; MR thin film transducers; areal density; design; fabrication; hard disk devices; magnetic materials; magnetoresistive sensors; processing technology; recording heads; review; tape storage devices; Fabrication; Hard disks; Magnetic heads; Magnetic materials; Magnetic sensors; Magnetoresistance; Sensor phenomena and characterization; Thin film sensors; Transducers; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490062

Filename

490062