DocumentCode :
79121
Title :
A 1.65 W fully integrated 90 nm bulk cmos capacitive DC-DC converter with intrinsic charge recycling
Author :
Meyvaert, H. ; Van Breussegem, Tom ; Steyaert, M.
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ. Leuven, Heverlee, Belgium
Volume :
28
Issue :
9
fYear :
2013
fDate :
Sept. 2013
Firstpage :
4327
Lastpage :
4334
Abstract :
A fully integrated high power density capacitive 2:1 step-down DC-DC converter is designed in a standard CMOS technology. The converter implements the presented flying well technique and intrinsic charge recycling technique to deliver a maximum output power of 1.65 W on a chip area of 2.14 mm2, resulting in a power conversion density of 0.77 W/mm2 . A peak power conversion efficiency of 69% is achieved, leading to an efficiency enhancement factor of +36% with respect to a linear regulator. This is for a voltage step-down conversion from twice the nominal supply voltage of a 90 nm technology (2Vdd = 2.4 V) to 1 V.
Keywords :
CMOS integrated circuits; DC-DC power convertors; bulk CMOS capacitive DC-DC converter; efficiency enhancement factor; high power density capacitive; intrinsic charge recycling technique; linear regulator; nominal supply voltage; peak power conversion efficiency; power 1.65 W; size 90 nm; standard CMOS technology; voltage 1 V; voltage step down conversion; CMOS integrated circuits; Capacitors; Density measurement; Impedance; Recycling; Topology; Voltage control; Capacitive; DC–DC converter; fully integrated; intrinsic charge recycling (ICR); power converter; switched capacitor;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2012.2230339
Filename :
6363613
Link To Document :
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