• DocumentCode
    791225
  • Title

    Computation of bit-error probabilities for optical receivers using thin avalanche photodiodes

  • Author

    Choi, Byonghyok ; Hayat, Majeed M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
  • Volume
    10
  • Issue
    1
  • fYear
    2006
  • fDate
    1/1/2006 12:00:00 AM
  • Firstpage
    56
  • Lastpage
    58
  • Abstract
    The large-deviation-based asymptotic-analysis and importance-sampling methods for computing bit-error probabilities for avalanche-photodiode (APD) based optical receivers, developed by Letaief and Sadowsky [IEEE Trans. Inform. Theory, vol. 38, pp. 1162-1169, 1992], are extended to include the effect of dead space, which is significant in high-speed APDs with thin multiplication regions. It is shown that the receiver´s bit-error probability is reduced as the magnitude of dead space increases relative to the APD´s multiplication-region width. The calculated error probabilities and receiver sensitivities are also compared with those obtained from the Chernoff bound.
  • Keywords
    avalanche breakdown; avalanche photodiodes; error statistics; importance sampling; optical receivers; sensitivity analysis; Chernoff bound; asymptotic-analysis; avalanche photodiode; bit-error probability; high-speed APD; importance-sampling method; large deviation theory; optical receiver sensitivity; thin multiplication region; Avalanche photodiodes; Error analysis; Error probability; Fluctuations; Gaussian approximation; Impact ionization; Optical computing; Optical receivers; Space exploration; Statistics;
  • fLanguage
    English
  • Journal_Title
    Communications Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1089-7798
  • Type

    jour

  • DOI
    10.1109/LCOMM.2006.1576569
  • Filename
    1576569