Title :
Basic module for an integrated optical phase difference measurement and correction system
Author :
Golubovic, B. ; Donnelly, J.P. ; Wang, C.A. ; Goodhue, W.D. ; Rediker, R.H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
A basic module for an integrated optical phase difference measurement and correction system was developed and fabricated in the AlGaAs-GaAs material system. The relative phase difference between two waveguides is measured using waveguide couplers to sample the optical field in each waveguide, a Y-junction interferometer with a small sinusoidal phase dither applied to one arm and a vertically integrated metal-semiconductor-metal detector. P/sup +/-n/sup -/n/sup +/ phase modulators are used to control the phase difference between the waveguides. This implementation makes it possible to measure and correct the relative phase difference between adjacent waveguides using only a few percent of the optical power of each guide.<>
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; integrated optics; integrated optoelectronics; light interferometers; metal-semiconductor-metal structures; modules; optical couplers; optical modulation; phase control; phase measurement; phase modulation; photodetectors; AlGaAs-GaAs; AlGaAs-GaAs material system; P/sup +/-n/sup -/n/sup +/ phase modulators; Y-junction interferometer; adjacent waveguides; basic module; integrated optical phase difference; measurement system; optical field; optical power; sinusoidal phase dither; vertically integrated metal-semiconductor-metal detector; waveguide couplers; Couplers; Integrated optics; Optical interferometry; Optical materials; Optical modulation; Optical waveguides; Phase detection; Phase measurement; Phase modulation; Power measurement;
Journal_Title :
Photonics Technology Letters, IEEE
