Magnetization vector measurement with wide-band high spatial resolution Kerr microscope

A new method for measuring three magnetization vector components with a Kerr microscope is proposed. By controlling the polarization distribution of a reflected light beam, it becomes possible to measure an in-plane component of the magnetization vector while simultaneously counteracting sensitivity to other components. And by switching the polarization distribution control, all three magnetization vector components can be measured. When combined with a gain switched violet laser diode based sampling method and a solid immersion lens, wide bandwidth and excellent spatial resolution is achieved.