DocumentCode
791279
Title
The magnetic reversal study of permalloy microdomains
Author
Huang, Y.W. ; Lo, C.K. ; Yao, Y.D. ; Ju, Jau-Jiu ; Jeng, Tzuan-Ren ; Huang, J.H.
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Tsing Hua Univ., Taiwan, Taiwan
Volume
39
Issue
5
fYear
2003
Firstpage
3444
Lastpage
3446
Abstract
For studying the influence of the current passed through a metal line for the magnetic cells on semiconductors, we prepared two types of the devices. Case 1 is that only one patterned permalloy cell on top of the insulated metal strip, and two cells are beside the strip. Case 2 is that all three patterned magnetic cells are on top of the strip. The magnetic field needed to reverse the magnetization of a submicrometer-size permalloy single domain cell with aspect ratio of 6 is larger than that of a unpatterned millimeter-size permalloy thin film due to the dimension effect. Magnetic force microscopy images of the patterned cells before and after applying various electrical currents were investigated. We have observed that: 1) the magnetic field produced by the word line will not change the magnetic configuration of the magnetic cells near the wires; 2) the magnetic field produced by the word line is quite uniform; and 3) for small aspect ratio of the submicrometer magnetic cells (<6), the magnetic configuration becomes multidomain, and higher magnetic field needed to reverse its magnetic state. Finally, we have shown a method that integrates an electric wire on semiconductors for generation of surrounding magnetic fields and patterned magnetic cells on micrometer length scales.
Keywords
Permalloy; magnetic domains; magnetic force microscopy; magnetisation reversal; NiFe; magnetic configuration; magnetic force microscopy; magnetic reversal; magnetization; permalloy microdomains; Insulation; Magnetic devices; Magnetic domains; Magnetic fields; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic semiconductors; Magnetization; Strips;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2003.816177
Filename
1233423
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