Title :
Electrostatic discharge damage of MR heads
Author :
Tian, Hong ; Lee, Jerry J K
Author_Institution :
Conner Peripherals, San Jose, CA, USA
fDate :
11/1/1995 12:00:00 AM
Abstract :
Two mechanisms of ESD damage of MR heads, electrothermal damage of MR sensors and dielectric breakdown of MR shields, were investigated. Experimental results of temperature rise within the MR sensors agree well with theoretical predictions
Keywords :
electric breakdown; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; temperature distribution; ESD damage; MR heads; MR sensors; MR shields; damage threshold; dielectric breakdown; electrostatic discharge; electrothermal damage; electrothermal failure; heat transfer model; magnetoresistive head; temperature rise; Electrostatic discharge; Electrothermal effects; Fault location; Heat transfer; Surface discharges; Surface treatment; Temperature sensors; Thermal conductivity; Thermal sensors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
