• DocumentCode
    791358
  • Title

    Influence of spacer thickness reduction on bias level and peak asymmetry in SAL-biased MR heads

  • Author

    Mitsumata, Chiharu ; Kobayashi, Toshio ; Liao, Simon H.

  • Author_Institution
    Magnetic & Electron. Mater. Res. Lab., Hitachi Metals Ltd., Saitama, Japan
  • Volume
    31
  • Issue
    6
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2630
  • Lastpage
    2632
  • Abstract
    The peak asymmetry relates to the bias level of a magnetoresistive sensor. However, the peak asymmetry is affected not only by bias level but also by the shape of the transfer curve. Measured MR bias level and peak asymmetry are less sensitive to bias current variation when the spacer thickness between MR and SAL is reduced. The numerical calculation shows that the magnetization distribution in the MR film becomes more uniform when a thinner spacer is used, indicating stronger magnetostatic coupling between layers. Calculated results of the peak asymmetry and the bias level versus bias current are in good agreement with the experimental data
  • Keywords
    magnetic heads; magnetic recording; magnetic thin film devices; magnetisation; magnetoresistive devices; MR film; SAL-biased MR heads; bias current variation; bias level; magnetization distribution; magnetoresistive sensor; magnetostatic coupling; numerical calculation; peak asymmetry; quasistatic testing; spacer thickness reduction; transfer curve shape; Coercive force; Current density; Demagnetization; Magnetic field measurement; Magnetic heads; Magnetization; Pulse measurements; Rough surfaces; Surface roughness; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.490075
  • Filename
    490075