DocumentCode :
791378
Title :
Micron and Submicron Particle Production
Author :
Hendricks, Charles D.
Author_Institution :
Charged Particle Research Laboratory, Department of Electrical Engineering, University of Illinois, Urbana, Ill. 61801.
Issue :
4
fYear :
1974
fDate :
7/1/1974 12:00:00 AM
Firstpage :
508
Lastpage :
510
Abstract :
In many fields of industrial interest, particle sampling and/or control is very important. However, the calibration and testing of sampling equipment have been difficult because of the lack of sources of uniform particles. In this paper a source of uniform solid or liquid particles is described together with the characteristics of the source and the particles produced. Fractional standard deviations of 10-3 in particle-size distribution are readily obtainable. The particles may be uncharged or charged to a predetermined level. Uses include the fields of aerosol sampling equipment testing, precipitator development and testing, as well as many others.
Keywords :
Aerosols; Air pollution; Calibration; Industrial control; Particle production; Sampling methods; Societies; Solids; Surface tension; Testing;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.1974.349187
Filename :
4157631
Link To Document :
بازگشت