DocumentCode :
791456
Title :
Phantom redundancy: a register transfer level technique for gracefully degradable data path synthesis
Author :
Karri, Ramesh ; Iyer, Balakrishnan ; Koren, Israel
Author_Institution :
Dept. of Electr. & Comput. Eng., Polytech. Univ. Brooklyn, NY, USA
Volume :
21
Issue :
8
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
877
Lastpage :
888
Abstract :
Presents an area-efficient register transfer level technique for gracefully degradable data path synthesis called phantom redundancy. In contrast to spare-based approaches, phantom redundancy is a recovery technique that does not use any standby spares. Phantom redundancy uses extra interconnect to make the resulting data path reconfigurable in the presence of any (single) functional unit failure. When phantom redundancy is combined with a concurrent error detection technique, error detection followed by reconfiguration is automatic. The authors developed a register transfer level synthesis algorithm that incorporates phantom redundancy constraints. There is a tight interdependence between reconfiguration of a (faulty) data path and scheduling and operation-to-operator binding tasks during register transfer level synthesis. They developed a genetic algorithm-based register transfer level synthesis approach to incorporate phantom redundancy constraints. The algorithm minimizes the performance degradation of the synthesized data path in the presence of any single faulty functional unit. The effectiveness of the technique and the algorithm are illustrated using high-level synthesis benchmarks.
Keywords :
VLSI; error detection; high level synthesis; integrated circuit design; redundancy; VLSI; concurrent error detection; concurrent error detection technique; functional unit failure; gracefully degradable data path synthesis; high-level synthesis benchmarks; operation-to-operator binding tasks; performance degradation; phantom redundancy; recovery technique; register transfer level technique; Automatic test pattern generation; Built-in self-test; Circuit faults; Degradation; Fault diagnosis; Imaging phantoms; Integrated circuit interconnections; Redundancy; Registers; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2002.800450
Filename :
1020346
Link To Document :
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