• DocumentCode
    791456
  • Title

    Phantom redundancy: a register transfer level technique for gracefully degradable data path synthesis

  • Author

    Karri, Ramesh ; Iyer, Balakrishnan ; Koren, Israel

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Polytech. Univ. Brooklyn, NY, USA
  • Volume
    21
  • Issue
    8
  • fYear
    2002
  • fDate
    8/1/2002 12:00:00 AM
  • Firstpage
    877
  • Lastpage
    888
  • Abstract
    Presents an area-efficient register transfer level technique for gracefully degradable data path synthesis called phantom redundancy. In contrast to spare-based approaches, phantom redundancy is a recovery technique that does not use any standby spares. Phantom redundancy uses extra interconnect to make the resulting data path reconfigurable in the presence of any (single) functional unit failure. When phantom redundancy is combined with a concurrent error detection technique, error detection followed by reconfiguration is automatic. The authors developed a register transfer level synthesis algorithm that incorporates phantom redundancy constraints. There is a tight interdependence between reconfiguration of a (faulty) data path and scheduling and operation-to-operator binding tasks during register transfer level synthesis. They developed a genetic algorithm-based register transfer level synthesis approach to incorporate phantom redundancy constraints. The algorithm minimizes the performance degradation of the synthesized data path in the presence of any single faulty functional unit. The effectiveness of the technique and the algorithm are illustrated using high-level synthesis benchmarks.
  • Keywords
    VLSI; error detection; high level synthesis; integrated circuit design; redundancy; VLSI; concurrent error detection; concurrent error detection technique; functional unit failure; gracefully degradable data path synthesis; high-level synthesis benchmarks; operation-to-operator binding tasks; performance degradation; phantom redundancy; recovery technique; register transfer level technique; Automatic test pattern generation; Built-in self-test; Circuit faults; Degradation; Fault diagnosis; Imaging phantoms; Integrated circuit interconnections; Redundancy; Registers; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2002.800450
  • Filename
    1020346