Title :
Automatic generation of synthetic sequential benchmark circuits
Author :
Hutton, Michael D. ; Rose, Jonathan S. ; Corneil, Derek G.
Author_Institution :
Dept. of Comput. Sci., Toronto Univ., Ont., Canada
fDate :
8/1/2002 12:00:00 AM
Abstract :
The design of programmable logic architectures and supporting computer-aided design tools fundamentally requires both a good understanding of the combinatorial nature of netlist graphs and sufficient quantities of realistic examples to evaluate or benchmark the results. In this paper, the authors investigate these two issues. They introduce an abstract model for describing sequential circuits and a collection of statistical parameters for better understanding the nature of circuits. Based upon this model they introduce and formally define the signature of a circuit netlist and the signature equivalence of netlists. They give an algorithm (GEN) for generating sequential benchmark netlists, significantly expanding previous work (Hutton et al, 1998) which generated purely combinational circuits. By comparing synthetic circuits to existing benchmarks and random graphs they show that GEN circuits are significantly more realistic than random graphs. The authors further illustrate the viabilty of the methodology by applying GEN to a case study comparing two partitioning algorithms.
Keywords :
circuit layout CAD; graph theory; logic CAD; programmable logic devices; sequential circuits; statistical analysis; GEN; abstract model; automatic generation; circuit netlist; computer-aided design tools; netlist graphs; placement; programmable logic architectures; random graphs; signature equivalence; statistical parameters; synthetic sequential benchmark circuits; Benchmark testing; Character generation; Circuit testing; Design automation; Logic circuits; Logic design; Partitioning algorithms; Programmable logic arrays; Programmable logic devices; Routing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2002.800456