• DocumentCode
    791656
  • Title

    The effect of surface topography on the soft magnetic properties of FeAlN films

  • Author

    Zheng, Pethui ; Bain, James A. ; Kryder, Mark H.

  • Author_Institution
    Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    31
  • Issue
    6
  • fYear
    1995
  • fDate
    11/1/1995 12:00:00 AM
  • Firstpage
    2700
  • Lastpage
    2702
  • Abstract
    FeAlN films were deposited on patterned lines of photoresist, hardcured before deposition, as well as on bare, flat substrates inclined at an angle to the sputter source. Both of these geometries were intended to examine the effect of oblique incidence deposition on the anisotropy of reactively sputtered FeAlN films. Films on topographic substrates showed anisotropy fields of up to 75 Oe, while films on bare tilted substrates showed anisotropy fields up to 100 Oe, presenting the possibility of low permeability in the sloping regions of thin film recording heads which utilize these materials for inductive head poles
  • Keywords
    aluminium compounds; iron compounds; magnetic anisotropy; magnetic permeability; magnetic thin films; soft magnetic materials; sputtered coatings; surface topography; FeAlN; FeAlN films; anisotropy; hardcured photoresist; inductive head poles; oblique incidence deposition; patterned lines; permeability; reactive sputtering; soft magnetic properties; surface topography; thin film recording heads; tilted substrates; topographic substrates; Anisotropic magnetoresistance; Geometry; Magnetic films; Magnetic heads; Magnetic properties; Permeability; Resists; Sputtering; Substrates; Surface topography;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.490097
  • Filename
    490097