High density recording characteristics of sputtered barium ferrite thin films

Author

Li, Jinshan ; Rosenblum, Stephen S. ; Nojima, Wendy ; Hayashi, Hidetaka ; Sinclair, Robert

Author_Institution

Dept. of Mater. Sci. & Eng., Stanford Univ., CA, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2749

Lastpage

2751

Abstract

We report the recording characteristics of in-situ crystallized sputtered barium ferrite (BaFe₁₂O₁₉, BaM) thin film media grown on a SiN coated carbon substrate. Using an inductive head with a gap of 0.27 μm at a flying height of 0.1 μm, a linear density, D₅₀, of more than 100 kfci was obtained. The pulse width, PW₅₀, was measured to be 0.35 μm. In contrast to Co alloy media, BaM media do not exhibit superlinear noise behavior, indicating non-exchange coupled grains. A model of decoupled grain assembly was used to calculate signal to noise ratio (SNR), giving calculated values in very good agreement with the experimentally measured values. In addition, the magnetic property optimization of sputtered BaM media was also investigated

Keywords

barium compounds; coercive force; ferrites; magnetic recording; magnetic thin films; sputtered coatings; 0.1 micron; 0.27 micron; BaFe₁₂O₁₉; coercive force; decoupled grain assembly; flying height; high density recording characteristics; inductive head; linear density; magnetic property optimization; nonexchange coupled grains; pulse width; signal to noise ratio; sputtered thin films; Barium; Crystallization; Ferrites; Magnetic heads; Pulse measurements; Signal to noise ratio; Silicon compounds; Space vector pulse width modulation; Sputtering; Substrates;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490139

Filename

490139