DocumentCode :
791996
Title :
Recording performance of longitudinal barium ferrite thin film media
Author :
Sui, Xiaoyu ; Singh, Ajay ; Chen, Yingiian ; Lambeth, David N. ; Krydeer, M.K.
Author_Institution :
Seagate Technol., Bloomington, MN, USA
Volume :
31
Issue :
6
fYear :
1995
fDate :
11/1/1995 12:00:00 AM
Firstpage :
2776
Lastpage :
2778
Abstract :
The high density recording characteristics of barium ferrite thin film media have been investigated. High levels of overwrite are achieved. Media microstructures have been identified to have a close relation to the noise behavior in the barium ferrite thin films. A linear increase in noise spectra is observed, indicating the existence of transition noise. In addition, positive ΔM peaks are seen in all longitudinal barium ferrite samples. Magnetostatic interactions rather than exchange interactions among neighboring grains are believed to be the cause of the positive ΔM. To reduce media noise, a reduction in both grain size and grain aspect ratio is necessary
Keywords :
barium compounds; ferrites; grain size; magnetic recording noise; magnetic thin films; BaFe12O19; Si wafer disk substrates; grain aspect ratio; grain size; high density recording characteristics; inductive heads; longitudinal barium ferrite thin film media; magnetoresistive heads; magnetostatic interactions; media microstructures; noise spectra; overwrite levels; transition noise; Barium; Disk recording; Ferrite films; Magnetic heads; Magnetic properties; Magnetic recording; Microstructure; Signal to noise ratio; Sputtering; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.490148
Filename :
490148
Link To Document :
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