Recording performance of longitudinal barium ferrite thin film media

Author

Sui, Xiaoyu ; Singh, Ajay ; Chen, Yingiian ; Lambeth, David N. ; Krydeer, M.K.

Author_Institution

Seagate Technol., Bloomington, MN, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2776

Lastpage

2778

Abstract

The high density recording characteristics of barium ferrite thin film media have been investigated. High levels of overwrite are achieved. Media microstructures have been identified to have a close relation to the noise behavior in the barium ferrite thin films. A linear increase in noise spectra is observed, indicating the existence of transition noise. In addition, positive ΔM peaks are seen in all longitudinal barium ferrite samples. Magnetostatic interactions rather than exchange interactions among neighboring grains are believed to be the cause of the positive ΔM. To reduce media noise, a reduction in both grain size and grain aspect ratio is necessary

Keywords

barium compounds; ferrites; grain size; magnetic recording noise; magnetic thin films; BaFe₁₂O₁₉; Si wafer disk substrates; grain aspect ratio; grain size; high density recording characteristics; inductive heads; longitudinal barium ferrite thin film media; magnetoresistive heads; magnetostatic interactions; media microstructures; noise spectra; overwrite levels; transition noise; Barium; Disk recording; Ferrite films; Magnetic heads; Magnetic properties; Magnetic recording; Microstructure; Signal to noise ratio; Sputtering; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490148

Filename

490148