• DocumentCode
    792011
  • Title

    Automating Postsilicon Debugging and Repair

  • Author

    Chang, Kai-Hui ; Markov, Igor L. ; Bertacco, Valeria

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI
  • Volume
    41
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    47
  • Lastpage
    54
  • Abstract
    Due to increasing semiconductor design complexity, more errors are escaping presilicon verification and being discovered only after manufacturing. As an alternative to traditional manual chip repair, the authors propose the FogClear methodology, which automates the postsilicon debugging process and thereby reduces IC development time and costs.
  • Keywords
    Computer bugs; Costs; Debugging; Delay; Design automation; Fabrication; Manufacturing; Process design; Silicon; Time to market; FogClear methodology; electronic design automation; integrated circuits; postsilicon debugging; validation;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.2008.212
  • Filename
    4563879
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=792011