Offtrack characteristics on media noise for Co-Cr-Ta films

Author

Tsuboi, S. ; Korenari, T. ; Ishiwata, N. ; Matsutera, H. ; Tagami, K.

Author_Institution

Functional Devices Res. Labs., NEC Corp., Kawasaki, Japan

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2791

Lastpage

2793

Abstract

The effect of remanent magnetic flux density (B_r) and magnetic layer thickness (δ) on offtrack noise characteristics in Co-Cr-Ta alloy thin films is investigated. It has been found that decreasing the value of B_r is a more effective method of improving offtrack noise characteristics than decreasing the value of δ. Offtrack noise is shown to be due to the fluctuations in the amplitude of readback waveforms, fluctuations which are caused by fluctuations in magnetic transition amplitude. It was observed, using a magnetic force microscope, that lower B_r media had sharp boundaries at the track edge regions and the magnetization was more uniform, compared with those of higher B_r media

Keywords

chromium alloys; cobalt alloys; magnetic domains; magnetic force microscopy; magnetic recording noise; magnetic thin films; remanence; tantalum alloys; Co-Cr-Ta; Co-Cr-Ta films; longitudinal recording media; magnetic domain patterns; magnetic force microscope; magnetic layer thickness; magnetic transition amplitude fluctuations; magnetization; media noise; offtrack noise characteristics; readback waveform amplitude fluctuations; remanent magnetic flux density; track edge regions; Bandwidth; Chromium; Fluctuations; Grain size; Magnetic noise; Magnetic recording; Noise level;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490153

Filename

490153