Title :
Offtrack characteristics on media noise for Co-Cr-Ta films
Author :
Tsuboi, S. ; Korenari, T. ; Ishiwata, N. ; Matsutera, H. ; Tagami, K.
Author_Institution :
Functional Devices Res. Labs., NEC Corp., Kawasaki, Japan
fDate :
11/1/1995 12:00:00 AM
Abstract :
The effect of remanent magnetic flux density (Br) and magnetic layer thickness (δ) on offtrack noise characteristics in Co-Cr-Ta alloy thin films is investigated. It has been found that decreasing the value of Br is a more effective method of improving offtrack noise characteristics than decreasing the value of δ. Offtrack noise is shown to be due to the fluctuations in the amplitude of readback waveforms, fluctuations which are caused by fluctuations in magnetic transition amplitude. It was observed, using a magnetic force microscope, that lower Br media had sharp boundaries at the track edge regions and the magnetization was more uniform, compared with those of higher Br media
Keywords :
chromium alloys; cobalt alloys; magnetic domains; magnetic force microscopy; magnetic recording noise; magnetic thin films; remanence; tantalum alloys; Co-Cr-Ta; Co-Cr-Ta films; longitudinal recording media; magnetic domain patterns; magnetic force microscope; magnetic layer thickness; magnetic transition amplitude fluctuations; magnetization; media noise; offtrack noise characteristics; readback waveform amplitude fluctuations; remanent magnetic flux density; track edge regions; Bandwidth; Chromium; Fluctuations; Grain size; Magnetic noise; Magnetic recording; Noise level;
Journal_Title :
Magnetics, IEEE Transactions on