DocumentCode :
792174
Title :
Double-layer no-flow underfill materials and process
Author :
Zhang, Zhuqing ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
26
Issue :
2
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
199
Lastpage :
205
Abstract :
The no-flow underfill has been invented and practiced in the industry for a few years. However, due to the interfering of silica fillers with solder joint formation, most no-flow underfills are not filled with silica fillers and hence have a high coefficient of thermal expansion (CTE), which is undesirable for high reliability. In a novel invention, a double-layer no-flow underfill is implemented to the flip-chip process and allows fillers to be incorporated into the no-flow underfill. The effects of bottom layer underfill thickness, bottom layer underfill viscosity, and reflow profile on the solder wetting properties are investigated in a design of experiment (DOE) using quartz chips. It is found that the thickness and viscosity of the bottom layer underfill are essential to the wetting of the solder bumps. Chip scale package (CSP) components are assembled using the double-layer no-flow underfill process. Silica fillers of different sizes and weight percentages are incorporated into the upper layer underfill. With a high viscosity bottom layer underfill, up to 40 wt% fillers can be added into the upper layer underfill and do not interfere with solder joint formation.
Keywords :
chip scale packaging; design of experiments; encapsulation; filled polymers; flip-chip devices; reflow soldering; wetting; SiO2; assembly yield; bottom layer underfill thickness; bottom layer underfill viscosity; chip scale package; coefficient of thermal expansion; design of experiment; double-layer no-flow underfill material; flip-chip process; quartz chip; reflow profile; reliability; silica filler; solder joint formation; wetting properties; Chip scale packaging; Curing; Electromagnetic compatibility; Electronic packaging thermal management; Materials science and technology; Silicon compounds; Soldering; Thermal expansion; Thermal stresses; Viscosity;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2003.817328
Filename :
1233580
Link To Document :
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