DocumentCode :
792283
Title :
Application of a new sensitivity analysis framework for voltage contingency ranking
Author :
Amjady, Nima ; Esmaili, Masoud
Author_Institution :
Dept. of Electr. Eng., Semnan Univ., Iran
Volume :
20
Issue :
2
fYear :
2005
fDate :
5/1/2005 12:00:00 AM
Firstpage :
973
Lastpage :
983
Abstract :
In this paper, a new sensitivity analysis framework for voltage contingency ranking has been presented. The proposed sensitivity analysis is a combination of linear sensitivities and eigenvalue analysis. The sensitivity analysis framework can determine the voltage stability status of the power system due to the occurrence of each contingency. Moreover, stability margin or instability depth of the post-contingency state is determined in the framework. In other words, a severity index is obtained for each voltage contingency and so the contingencies can be ranked. This rank shows bottlenecks of the power system in the priority order, a property that is a key issue for both planners and operators of the power system. The proposed method can also evaluate islanding contingencies as well as the nonislanding ones. Moreover, the method can consider the generator contingencies in addition to the branch contingencies in a unique framework. The proposed method has been tested on the New Zealand test system and Iran´s power network. Obtained results, discussed comprehensively, confirm the validity of the developed approach.
Keywords :
eigenvalues and eigenfunctions; power system stability; sensitivity analysis; Iran power network; New Zealand test system; eigenvalue analysis; linear sensitivity; sensitivity analysis; voltage contingency ranking; Eigenvalues and eigenfunctions; Power system analysis computing; Power system dynamics; Power system security; Power system stability; Power system transients; Reactive power; Sensitivity analysis; System testing; Voltage; Contingency ranking; sensitivity analysis; voltage contingency;
fLanguage :
English
Journal_Title :
Power Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8950
Type :
jour
DOI :
10.1109/TPWRS.2005.846088
Filename :
1425595
Link To Document :
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