Reactively evaporated Co thin film for tape media

Author

Pan, Tao ; Spratt, Geoffrey W.D.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

31

Issue

6

fYear

1995

fDate

11/1/1995 12:00:00 AM

Firstpage

2851

Lastpage

2853

Abstract

The dependence of the magnetic properties of reactively evaporated Co on film thickness and oxygen pressure have been studied. The coercivity was found to be very sensitive to oxygen pressure, but the coercive squareness and coercivity peak at different values of oxygen pressure for the same thickness. An optimized 500 Å Co-O film deposited at an oxygen pressure of 1.6 μtorr, exhibits a coercivity of 2000 Oe, a coercive squareness S* of 0.7, an M_rt of 2.2 memu/cm², a remanence squareness of 0.9 and an anisotropy constant of 3.5×10⁶ erg/cc. Auger spectroscopy reveals an oxygen content of 30 at.% throughout the film thickness

Keywords

Auger effect; cobalt; coercive force; ferromagnetic materials; magnetic anisotropy; magnetic tapes; magnetic thin films; remanence; vacuum deposited coatings; 1.6E-6 torr; Auger spectroscopy; Co:O; anisotropy constant; coercive squareness; coercivity; magnetic properties; oxygen pressure; reactively evaporated Co thin film; remanence squareness; tape media; Coercive force; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetic recording; Optical films; Perpendicular magnetic anisotropy; Saturation magnetization; Substrates; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.490173

Filename

490173