DocumentCode :
792868
Title :
Sensitivity of an Active Head Using NiFe/Al2O3 Multilayered Films
Author :
Iwasaki, H. ; Akiyama, J.
Author_Institution :
Toshiba R&D Center.
Volume :
4
Issue :
2
fYear :
1989
Firstpage :
97
Lastpage :
106
Abstract :
The sensitivity of a magnetic readout head employing induced RF permeability changes in NiFe/Al2O3 multilayered films (an active head) has been investigated by measuring the output voltage response to magnetic fields, taking the film thickness and width as parameters. All thick multilayered films had low coercivity and high permeability at frequencies of less than 50 MHz, though they exhibited a small decrease in induced RF permeability around 600 MHz, even when the film width was reduced to 10 ¿m. The sensitivity of all thick films rose by more than ten times compared with NiFe single-layered films, due to improvements in the soft magnetic properties and reduced eddy currents.
Keywords :
Coercive force; Magnetic field measurement; Magnetic films; Magnetic heads; Permeability measurement; Radio frequency; Soft magnetic materials; Thick films; Thickness measurement; Voltage measurement;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1989.4563969
Filename :
4563969
Link To Document :
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