DocumentCode :
79330
Title :
A Low-Cost CMOS Smart Temperature Sensor Using a Thermal-Sensing and Pulse-Shrinking Delay Line
Author :
Chun-Chi Chen ; Hao-wen Chen
Author_Institution :
Dept. of Electron. Eng., Nat. Kaohsiung First Univ. of Sci. & Technol., Kaohsiung, Taiwan
Volume :
14
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
278
Lastpage :
284
Abstract :
This paper presents an economical time-domain CMOS smart temperature sensor with only one delay line. With the use of a path selection circuit, the delay line was used to first sense the temperature, to generate a pulse with a width proportional to absolute temperature (PTAT). The original delay line was then reused to measure the PTAT pulse. Final digital code conversion was fulfilled using a simple counter. Compared with former work with two delay lines, the proposed work with the novel structure can reduce one delay line to lower the circuit area. The proposed circuit was fabricated in a TSMC CMOS 0.35- μm 2P4M digital process, and had an extremely small chip area of 0.025 mm2, which is currently the best size among smart temperature sensors that has ever been reported when considering the CMOS process. The achieved measurement errors for eight chips are within -0.8°C-1.0 °C after two-point calibration over a 0 °C-100 °C temperature range. The effective resolution is measured to be 0.2 °C, and the power consumption is 1.5 μW at a sampling rate of 10 samples per second.
Keywords :
CMOS integrated circuits; calibration; delay lines; integrated circuit measurement; intelligent sensors; pulse generators; pulse measurement; temperature measurement; temperature sensors; time-domain analysis; PTAT pulse measurement; TSMC CMOS 2P4M digital process; calibration; digital code conversion; path selection circuit; power 1.5 muW; power consumption; proportional to absolute temperature; pulse generation; pulse-shrinking delay line; simple counter; size 0.35 mum; temperature 0 degC to 100 degC; thermal-sensor; time-domain CMOS smart temperature sensor; CMOS integrated circuits; Delay lines; Logic gates; Temperature measurement; Temperature sensors; Time measurement; Delay line; pulse shrinking; smart temperature sensor; thermal sensing;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2013.2282828
Filename :
6654306
Link To Document :
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