• DocumentCode
    793696
  • Title

    Impact of low-temperature buffer layers on nitride-based optoelectronics

  • Author

    Amano, Hiroshi ; Kamiyama, Satoshi ; Akasaki, Isamu

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Meijo Univ., Nagoya, Japan
  • Volume
    90
  • Issue
    6
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    1015
  • Lastpage
    1021
  • Abstract
    A historical overview and recent trends in the research and development of nitride-based light emitters are presented. The growth of GaN using a low-temperature-deposited buffer layer conductivity control, and the use of GaInN alloys, by which nonradiative recombination centers in nitrides are screened, have been employed to fabricate high-efficiency blue and green light-emitting diodes. Today, luminous flux efficiency of up to 50 lm/W at a specific wavelength is available. Electrical pumping has realized commercial laser diodes in the violet and blue regions. Several milestones in the realization of these achievements are reviewed. Future prospects of the nitride-based light emitters are also discussed.
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; electroluminescence; gallium compounds; light emitting diodes; reviews; semiconductor lasers; wide band gap semiconductors; AlGaN-GaN; AlGaN/GaN system; EL spectrum; GaInN alloys; GaN growth; III-nitride based optoelectronics; MOVPE growth; UV LED; blue region; conductivity control; electrical pumping; high-efficiency blue light-emitting diodes; high-efficiency green light-emitting diodes; historical overview; laser diodes; low-temperature buffer layers; luminous flux efficiency; nitride-based light emitters; nonradiative recombination centers; violet region; Buffer layers; Conductivity; Crystallization; Epitaxial growth; Epitaxial layers; Gallium nitride; Impurities; Light emitting diodes; Reproducibility of results; Substrates;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2002.1021566
  • Filename
    1021566