Title :
A high-sensitivity CMOS image sensor with gain-adaptive column amplifiers
Author :
Sakakibara, Masaki ; Kawahito, Shoji ; Handoko, Dwi ; Nakamura, Nobuo ; Satoh, Hiroki ; Higashi, Mizuho ; Mabuchi, Keiji ; Sumi, Hirofumi
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
fDate :
5/1/2005 12:00:00 AM
Abstract :
A high-sensitivity CMOS image sensor using gain-adaptive column amplifiers is presented and tested. The use of high gain for the column amplifier reduces input-referred random noise, and when coupled with a column-based digital noise cancellation technique, also reduces fixed pattern noise. An experimental application of the circuit using 0.25-μm CMOS technology with pinned photodiodes gave an rms random noise of 263 μV and an rms fixed pattern noise of 50 μV.
Keywords :
CMOS image sensors; amplifiers; circuit noise; random noise; 0.25 micron; 263 muV; 50 muV; CMOS technology; column-based digital noise cancellation; fixed pattern noise reduction; gain-adaptive column amplifiers; high-sensitivity CMOS image sensor; input-referred random noise; low readout noise; pinned photodiodes; rms fixed pattern noise; rms random noise; CMOS image sensors; CMOS technology; Circuit noise; Image sensors; Low-noise amplifiers; Noise cancellation; Noise level; Noise reduction; Photodiodes; Semiconductor device noise; CMOS image sensors; column amplifier; gain-adaptive amplifier; low readout noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2005.845969
