• DocumentCode
    793782
  • Title

    The Recovered Charge Characteristics of High Power Thyristors

  • Author

    Matteson, Frederick M. ; Ruhl, Harold J., Jr. ; Shafer, Peter O. ; Wolley, E.Duane

  • Author_Institution
    Semiconductor Products Department, General Electric Company, Auburn, NY 13021.
  • Issue
    3
  • fYear
    1976
  • fDate
    5/1/1976 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    311
  • Abstract
    The recovery characteristics of high power thyristors and diodes becomes increasingly important to the circuit designer as devices are made larger and faster. This paper considers various types of recovery as well as some important circuit influences on the recovery characteristics of power devices. Low and high frequency device data are presented for a number of different circuit conditions. The effects of spreading velocity, peak current during conduction, conduction pulsewidth, and commutating di/dt are considered. A new method for recovered charge data presentation is shown and some practical test circuit design considerations are discussed.
  • Keywords
    Circuit testing; Current measurement; Industry Applications Society; Probes; Pulse circuits; RLC circuits; Semiconductor device testing; Space vector pulse width modulation; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.1976.349448
  • Filename
    4157879