• DocumentCode
    793820
  • Title

    Excitonic properties in semiconductor quantum wells: numerical calculations and scaling behavior

  • Author

    Campi, Domenico ; Villavecchia, Carlo

  • Author_Institution
    Lab. Telecomunicazioni SpA, Torino, Italy
  • Volume
    28
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    1765
  • Lastpage
    1772
  • Abstract
    An approach is described for the calculation of binding energies of confined excitons in III-V semiconductors as functions of the quantum-well width. The method, which avoids the prescription of trial functions, provides direct interpretations of the dimensionality of the confined systems and shows evidence of greater flexibility than has been previously reported. Numerical results are provided concerning four technologically relevant material systems. With the method presented, the evolution of the exciton oscillator strength, as an explicit function of the well width, has been obtained. The analysis of the results suggests the formulation of scaling laws yielding the exciton properties as functions of the well width for all the materials considered
  • Keywords
    binding energy; excitons; oscillator strengths; semiconductor quantum wells; III-V semiconductors; SQW; binding energies; confined systems; dimensionality; exciton oscillator strength; exciton properties; quantum-well width; scaling behavior; semiconductor quantum wells; technologically relevant material systems; Excitons; Optical devices; Optical materials; Optical modulation; Optical switches; Oscillators; Quantum well devices; Quantum wells; Semiconductor materials; Telecommunications;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.142573
  • Filename
    142573