Dissipation in Solid-State Devices--The Magic of Il + N
Author :
Newell, William E.
Issue :
4
fYear :
1976
fDate :
7/1/1976 12:00:00 AM
Firstpage :
386
Lastpage :
396
Abstract :
The current capacity of a solid-state device, as ordinarily rated, varies widely depending on the current waveform, duty cycle, case temperature, etc. The underlying junction temperature limits should, however, be invariant.
Keywords :
Computer aided manufacturing; Impedance; Power electronics; Power system transients; Semiconductor diodes; Solid state circuits; Surges; Temperature dependence; Thyristors; Voltage;
