DocumentCode

794097

Title

Competition between Base and Substrate Junctions for Free Carriers in Microcircuit Collector Regions

Author

Bowman, W.C.

Author_Institution

The Boeing Company Aerospace Group Seattle, Washington

Volume

16

Issue

6

fYear

1969

Firstpage

111

Lastpage

113

Keywords

Current density; Current measurement; Electric resistance; Ionization; Leakage current; Photoconductivity; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1969.4325512

Filename

4325512