Title :
High-Throughput and Low-Complexity BCH Decoding Architecture for Solid-State Drives
Author :
Youngjoo Lee ; Hoyoung Yoo ; Injae Yoo ; In-Cheol Park
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Abstract :
This paper presents a high-throughput and low-complexity BCH decoder for NAND flash memory applications, which is developed to achieve a high data rate demanded in the recent serial interface standards. To reduce the decoding latency, a data sequence read from a flash memory channel is re-encoded by using the encoder that is idle at that time. In addition, several optimizing methods are proposed to relax the hardware complexity of a massive-parallel BCH decoder and increase the operating frequency. In a 130-nm CMOS process, a (8640, 8192, 32) BCH decoder designed as a prototype provides a decoding throughput of 6.4 Gb/s while occupying an area of 0.85 mm2.
Keywords :
BCH codes; CMOS digital integrated circuits; decoding; flash memories; optimisation; CMOS process; NAND flash memory applications; data sequence; decoding throughput; encoder; flash memory channel; hardware complexity; high data rate; high-throughput architecture; low-complexity BCH decoding architecture; massive-parallel decoder; operating frequency; optimizing methods; serial interface standards; size 130 nm; solid-state drives; BCH code; VLSI; VLSI.; circuit optimization; digital integrated circuits (ICs); flash memory;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2013.2264687