• DocumentCode
    79417
  • Title

    Lower Bound of Electrical Field for Maintaining a GaAs Photoconductive Semiconductor Switch in High-Gain Operating Mode

  • Author

    Wei Shi ; Xinmei Wang ; Lei Hou

  • Author_Institution
    Res. Center for Ultrafast Photoelectric Technol., Xi´an Univ. of Technol., Xi´an, China
  • Volume
    60
  • Issue
    4
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    1361
  • Lastpage
    1364
  • Abstract
    The high-gain operating mode of gallium arsenide (GaAs) photoconductive semiconductor switch (PCSS) brings the hope that a higher power PCSS will be triggered by a lower energy laser. However, the lock-on effect of high-gain PCSS restricts its lifetime and some other applications. In this paper, it is experimentally demonstrated that dynamically controlling the electrical field across a GaAs:EL2 PCSS can terminate the carrier avalanche and that there exists a lower bound of electrical field (about 3.64 kV/cm) for maintaining the high-gain operating mode of the PCSS under different conditions. This lower bound of electrical field is approximately equal to that of the transferred-electron effect; hence, it supports the hypothesis of a photon-activated charge domain to explain the physical phenomena of the high-gain PCSS.
  • Keywords
    III-V semiconductors; electric field effects; gallium arsenide; photoconducting switches; GaAs; GaAs photoconductive semiconductor switch; GaAs:EL2 PCSS; carrier avalanche; electrical field; high-gain PCSS; high-gain operating mode; lock-on effect; lower bound; lower energy laser; photon-activated charge domain; power PCSS; transferred-electron effect; Educational institutions; Electric variables measurement; Gallium arsenide; Laser mode locking; Measurement by laser beam; Optical switches; Gallium arsenide (GaAs); high-gain mode; photoconductive switch; transferred-electron effect;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2244094
  • Filename
    6473876