Statistical resistance to detection [digital circuits testing]

Author

Boneh, A. ; Savir, J.

Author_Institution

IBM Israel Sci. Center, Haifa, Israel

Volume

41

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

123

Lastpage

126

Abstract

Discusses the problem of estimating the sum of the detection probabilities of the yet unobserved faults during a random pattern test of a given digital circuit. The authors describe a statistical method for this purpose. The method requires keeping track of each fault until it is detected for the second time, and thus the simulation cost is about twice the cost of a similar simulation which abandons faults after their first detect. The benefits of having an estimate of the sum of these detection probabilities are twofold: (1) it provides a good stopping rule whenever 100% fault coverage is infeasible (which is often the case), and (2) it provides an estimate of the required effort to detect the next fault. The results of tests performed on some circuits are presented

Keywords

automatic testing; digital circuits; fault location; integrated circuit testing; logic testing; detection probabilities; digital circuit; digital circuits testing; fault coverage; random pattern test; simulation cost; statistical method; Circuit faults; Circuit simulation; Circuit testing; Costs; Digital circuits; Electrical fault detection; Fault detection; Performance evaluation; Probability; Statistical analysis;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.123388

Filename

123388