DocumentCode :
794195
Title :
Stress Induced Magnetic Anisotropy of YBi2Fe5-xGaxO12 Sputtered Films
Author :
Kigami, Y. ; Namikawa, T. ; Yamazaki, Y.
Author_Institution :
Tokyo Institute of Technology.
Volume :
5
Issue :
4
fYear :
1990
fDate :
4/1/1990 12:00:00 AM
Firstpage :
319
Lastpage :
324
Abstract :
In order to study the origin of perpendicular magnetic anisotropy in Bi-substituted iron garnet thin films, a series of samples with composition YBi2Fe5-xGaxO12 (0.36/≪x/≪0.97) was prepared by rf sputtering onto several substrates with various thermal expansion coefficients. The stress (¿) was calculated from the difference in thermal expansion of the film and substrate. The anisotropy constant (Ku) of the films increased linearly with ¿ in the range from ¿ = ¿9.0×109 erg/cm3 to 3.0×109 erg/cm3. The Ku decreased linearly with x in the composition range studied. The experimental results are discussed and compared with results for Al-substituted films.
Keywords :
Magnetic anisotropy; Magnetic films; Magnetic materials; Optical films; Perpendicular magnetic anisotropy; Sputtering; Substrates; Tensile stress; Thermal expansion; Thermal stresses;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1990.4564122
Filename :
4564122
Link To Document :
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