Title :
Design and Performance of an Integrated Circuit Flip Flop with Photocurrent Compensation
Author :
Aiken, J.G. ; Crabbe, J.S. ; Spence, H.W. ; Kinoshita, G. ; Phillips, H.
Author_Institution :
Texas Instruments Incorporated Dallas, Texas
Abstract :
The design and testing of a dielectrically isolated integrated circuit Set-Reset (RS) flip flop is described. The flip flops were fabricated with bipolar transistors having a primary photocurrent sensitivity of 3-5 Ã 10-11 mA/rad(Si)/s. The flip flops were capable of being switched on clock command during a 400 nsec electron beam pulse with a peak dose rate of 1.6 Ã 1011 rad(Si)/s.
Keywords :
Bipolar transistors; Circuit testing; Clocks; Dielectrics; Diodes; Instruments; Integrated circuit testing; Ionizing radiation; Photoconductivity; Radiation hardening;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1969.4325523