Title :
A Comparison of the Ionizing Radiation Response of Microcircuits Manufactured by Five Different Technologies
Author :
Nichols, D.K. ; Nielsen, R.L.
Author_Institution :
Autonetics Division of North American Rockwell
Abstract :
The ionizing radiation responses of seven integrated circuit types having different circuit functions are considered. Each circuit type was manufactured using several different construction technologies. In all, five technologies have been theoretically and experimentally analyzed. A comparison illustrates the degree of improvement and the differences in resulting failure modes when more advanced technologies are used.
Keywords :
Circuit analysis computing; Dielectric devices; Doping; Gold; Integrated circuit technology; Ionizing radiation; Manufacturing; Photoconductivity; Radiation effects; Resistors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1969.4325524