Title :
Test structure for crosstalk characterisation
Author :
Picot, F. ; Coll, P. ; Auvergne, D.
Author_Institution :
ATMEL ROUSSET, France
fDate :
7/18/2002 12:00:00 AM
Abstract :
Based on the characterisation of an industrial driver library in terms of crosstalk-induced noise possibility, a specific test structure to measure crosstalk signal on interconnect lines is presented. An original implementation is proposed for direct amplitude and pulse width measurement of the crosstalk-induced parasitic signal. A validation is given with HSPICE simulation of the extracted layout of the structure implemented in a 0.25 μm process
Keywords :
SPICE; VLSI; circuit layout CAD; circuit simulation; crosstalk; integrated circuit interconnections; integrated circuit layout; integrated circuit testing; 0.25 micron; HSPICE simulation; VLSI; crosstalk characterisation; crosstalk signal; crosstalk-induced parasitic signal; direct amplitude measurement; extracted layout; industrial driver library; interconnect lines; pulse width measurement; test structure;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020544
