Title :
BIST scheme for DAC testing
Author :
Chang, S.J. ; Lee, C.-L. ; Chen, J.E.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan
fDate :
7/18/2002 12:00:00 AM
Abstract :
A low-cost, built-in self-test (BIST) scheme for a digital-to-analogue converter (DAC) is presented. The basic idea is to convert the DAC output voltages corresponding to different input codes into different oscillation frequencies through a voltage controlled oscillator (VCO), and further transfer these frequencies to different digital codes using a counter. According to the input and output codes, performances of a DAC, such as offset error, gain error, differential nonlinearity (DNL), integral nonlinearity (INL), could be effectively detected by simply using digital circuits rather than complex analogue ones. In addition, the annoying DAC output noise could be naturally filtered out by this BIST method
Keywords :
automatic test pattern generation; built-in self test; digital-analogue conversion; integrated circuit testing; mixed analogue-digital integrated circuits; voltage-controlled oscillators; BIST scheme; DAC testing; different digital codes; differential nonlinearity; digital signal processor; gain error; index counter; integral nonlinearity; low-cost; mixed-signal IC; multiplexer; noise effect reduction; offset error; pattern counter; test pattern generator; voltage controlled oscillator;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020530
