DocumentCode :
794267
Title :
Probability density estimation from optimally condensed data samples
Author :
Girolami, Mark ; He, Chao
Author_Institution :
Sch. of Inf. & Commun. Technol., Paisley Univ., UK
Volume :
25
Issue :
10
fYear :
2003
Firstpage :
1253
Lastpage :
1264
Abstract :
The requirement to reduce the computational cost of evaluating a point probability density estimate when employing a Parzen window estimator is a well-known problem. This paper presents the Reduced Set Density Estimator that provides a kernel-based density estimator which employs a small percentage of the available data sample and is optimal in the L2 sense. While only requiring 𝒪(N2) optimization routines to estimate the required kernel weighting coefficients, the proposed method provides similar levels of performance accuracy and sparseness of representation as Support Vector Machine density estimation, which requires 𝒪(N3) optimization routines, and which has previously been shown to consistently outperform Gaussian Mixture Models. It is also demonstrated that the proposed density estimator consistently provides superior density estimates for similar levels of data reduction to that provided by the recently proposed Density-Based Multiscale Data Condensation algorithm and, in addition, has comparable computational scaling. The additional advantage of the proposed method is that no extra free parameters are introduced such as regularization, bin width, or condensation ratios, making this method a very simple and straightforward approach to providing a reduced set density estimator with comparable accuracy to that of the full sample Parzen density estimator.
Keywords :
learning automata; parameter estimation; pattern recognition; Parzen window; computational cost; point probability density; probability density estimation; sparse representation; support vector machine; Application software; Chaos; Computational efficiency; Constraint optimization; Density functional theory; Helium; Kernel; Optimization methods; Support vector machines; Testing;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2003.1233899
Filename :
1233899
Link To Document :
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