DocumentCode
794289
Title
An analysis of the probabilistic behavior of linear feedback signature registers
Author
Ivanov, André ; Agarwal, Vinod K.
Author_Institution
Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume
8
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
1074
Lastpage
1088
Abstract
The authors present an analysis technique useful for studying the probabilistic behavior of signature analysis registers, which is in turn useful for studying the aliasing problem. The technique is applicable to all linear-feedback signature analysis registers, i.e. characterized by any linear-feedback polynomial, including multiple-input signature registers. The basis for the technique is the calculation of a sequence of probabilities where the i th element of the sequence corresponds to the probability that one particular stage of the linear-feedback signature register (LFSR) is in the state 0 or 1 after the i th bit has been shifted in the LFSR. The complexity for calculating such a single-stage state probability sequence is linear in time and space. The authors generalize such sequences to k -stage state probability sequences
Keywords
automatic testing; feedback; logic testing; polynomials; probability; shift registers; BIST compaction; aliasing; built-in self test; digital testing; linear feedback signature registers; linear-feedback polynomial; monitoring heuristic; multiple-input signature registers; probabilistic behavior; single-stage state probability sequence; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Feedback circuits; Monitoring; Polynomials; Probability; Registers;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.39069
Filename
39069
Link To Document