• DocumentCode
    794323
  • Title

    Measurements of Stress Waves in Solids by Dynamc Photoelasticity

  • Author

    Honnold, V.R. ; Berggren, C.C. ; Peffley, W.M.

  • Author_Institution
    Hughes Aircraft Company Fullerton, California
  • Volume
    16
  • Issue
    6
  • fYear
    1969
  • Firstpage
    255
  • Lastpage
    259
  • Abstract
    The technique of dynamic stress-birefringence has been applied in two unique ways to a study of stress waves in solids. Observations of both longitudinal and shear waves, induced in Plexiglas by a pulsed beam of high-energy electrons, have been made with a polariscope operating in the visible. Stress waves induced in silicon by an exploding wire facility were studied with the polariscope in the infrared. The theories of thermoelasticity and birefringence are reviewed briefly and solutions describing stress induced by transient energy depositions are obtained. These solutions are compared to experimental results obtained with a flash x-ray generator.
  • Keywords
    Birefringence; Electron beams; Photoelasticity; Polarization; Silicon; Solids; Stress measurement; Thermal stresses; Thermoelasticity; Wire;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1969.4325535
  • Filename
    4325535