DocumentCode
794323
Title
Measurements of Stress Waves in Solids by Dynamc Photoelasticity
Author
Honnold, V.R. ; Berggren, C.C. ; Peffley, W.M.
Author_Institution
Hughes Aircraft Company Fullerton, California
Volume
16
Issue
6
fYear
1969
Firstpage
255
Lastpage
259
Abstract
The technique of dynamic stress-birefringence has been applied in two unique ways to a study of stress waves in solids. Observations of both longitudinal and shear waves, induced in Plexiglas by a pulsed beam of high-energy electrons, have been made with a polariscope operating in the visible. Stress waves induced in silicon by an exploding wire facility were studied with the polariscope in the infrared. The theories of thermoelasticity and birefringence are reviewed briefly and solutions describing stress induced by transient energy depositions are obtained. These solutions are compared to experimental results obtained with a flash x-ray generator.
Keywords
Birefringence; Electron beams; Photoelasticity; Polarization; Silicon; Solids; Stress measurement; Thermal stresses; Thermoelasticity; Wire;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1969.4325535
Filename
4325535
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