Title :
USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
Keywords :
Chemical industry; Electronic equipment testing; Ionizing radiation; Laboratories; Nuclear Instruments - n42; Radiation detectors; Semiconductor device testing; Semiconductor radiation detectors; Silicon; USA Councils;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1969.4325538
