Title :
Parasitic-aware design and optimization of a CMOS RF power amplifier
Author :
Choi, Kiyong ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
Implementation of fully integrated CMOS RF power amplifiers is a challenge owing to the low breakdown voltage of aggressively scaled CMOS transistors and parasitic effects associated with on-chip passive components. To address this problem, a parasitic-aware design and optimization paradigm and novel power amplifier circuit design techniques are proposed. The parasitic-aware synthesis described herein employs a simulated annealing algorithm that includes an adaptive tunneling mechanism and post-optimization sensitivity analysis (i.e., design centering) with respect to process, voltage, and temperature variations. Several design techniques are introduced including a self-biased power-amplifier configuration and a digitally controlled conduction angle topology. The techniques are validated via the design of a fully differential nonlinear three-stage 900-MHz GSM power amplifier integrated in 2 mm2 in 250-nm CMOS that outputs 2 W (1.5 W) with 30% (43%) drain efficiency from a single 3.0-V (2.5-V) power supply.
Keywords :
CMOS integrated circuits; UHF power amplifiers; integrated circuit design; radiofrequency integrated circuits; sensitivity analysis; simulated annealing; 1.5 W; 2 W; 2.5 V; 250 nm; 3 V; 900 MHz; CMOS RF power amplifier; CMOS transistors; GSM power amplifier; UHF amplifiers; adaptive tunneling mechanism; breakdown voltage; conduction angle topology; on-chip passive components; parasitic effects; post-optimization sensitivity analysis; power amplifier circuit design; self-biased configuration; simulated annealing algorithm; Analytical models; Circuit simulation; Circuit synthesis; Design optimization; Integrated circuit synthesis; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Simulated annealing; Tunneling; Power amplifiers (PAs); UHF amplifiers; radio frequency (RF) amplifiers;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.854608