Title :
Analysis of magnetic induction distribution by scanning Lorentz/interference electron microscopy
Author :
Takahashi, Yoshio ; Yajima, Yusuke ; Ichikawa, Masakazu ; Kuroda, Katsuhiro
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fDate :
11/1/1995 12:00:00 AM
Abstract :
A new observation technique of magnetic induction base on the combination of differential phase contrast and interface electron microscopy has been developed. This technique can be used to clearly to visualize the magnetic induction distribution in and around the specimen. Furthermore, the quantitative determination of induction strength with a unit of h/e (h: Planck´s constant, e: electron charge) can also be made possible
Keywords :
electromagnetic induction; electron microscopy; magnetic variables measurement; scanning electron microscopy; differential phase contrast; magnetic induction distribution; scanning Lorentz electron microscopy; scanning interference electron microscopy; Detectors; Electron beams; Interference; Magnetic analysis; Magnetic flux; Magnetic force microscopy; Magnetic separation; Probes; Scanning electron microscopy; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
