• DocumentCode
    794674
  • Title

    AlGaN-GaN HEMTs on SiC with CW power performance of >4 W/mm and 23% PAE at 35 GHz

  • Author

    Lee, C. ; Saunier, P. ; Jinwei Yang ; Khan, Muhammad Asad

  • Author_Institution
    Res. & Dev. Eng., TriQuint Semicond. Texas, Richardson, TX, USA
  • Volume
    24
  • Issue
    10
  • fYear
    2003
  • Firstpage
    616
  • Lastpage
    618
  • Abstract
    Continuous wave Ka-band power performance of AlGaN-GaN high electron-mobility transistors grown on semi-insulating SiC substrates are reported. The devices, with gate lengths of 0.25 μm, exhibited maximum drain current density of 1.1 A/mm and peak extrinsic transconductance of 285 mS/mm. At 35 GHz, an output power density of 4.13 W/mm with 23% of power-added efficiency (PAE) and 7.54 dB of linear gain were achieved at a drain bias of 30 V. These power results represent the best power density, PAE, and gain combination reported at this frequency. The drain bias dependence of the Ka-band power performance of these devices is also presented.
  • Keywords
    III-V semiconductors; aluminium compounds; current density; gallium compounds; millimetre wave field effect transistors; millimetre wave power transistors; power HEMT; silicon compounds; substrates; wide band gap semiconductors; 0.25 micron; 23 percent; 285 mS/mm; 30 V; 35 GHz; 7.54 dB; AlGaN-GaN; AlGaN-GaN HEMT; EHF; Ka-band power performance; MM-wave power transistors; PAE; SiC; drain current density; high electron-mobility transistors; linear gain; peak extrinsic transconductance; power density; power-added efficiency; semi-insulating SiC substrates; Aluminum gallium nitride; Gain; Gallium nitride; HEMTs; MODFETs; Microwave devices; Power amplifiers; Power generation; Silicon carbide; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2003.817383
  • Filename
    1233932