Title :
A multiple seed linear feedback shift register
Author :
Savir, J. ; Mcanney, William H.
Author_Institution :
IBM, Poughkeepsie, NY, USA
fDate :
2/1/1992 12:00:00 AM
Abstract :
The authors describe a design of an LFSR (linear feedback shift register) that can easily accommodate a change-of-seeds feature. This new LFSR is controlled by two separate clocks, one for the normal LFSR operation and one for the change of seeds option. The change of seeds is fast since it is accomplished by a pair of clock pulses rather than by long scan operations
Keywords :
built-in self test; feedback; shift registers; LFSR; change-of-seeds; clock pulses; multiple seed linear feedback shift register; Built-in self-test; Computer architecture; Costs; Electrons; History; Linear feedback shift registers; Memory management; Notice of Violation; Reduced instruction set computing; Scheduling;
Journal_Title :
Computers, IEEE Transactions on
